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The Software Support for Metrology (SSfM) programme underpins the NMS, focussing on the use of mathematics and computing in metrology. It aims to extend the range of techniques and applications available to meet the continually changing needs of metrology.
Solutions to problems specific to one field of measurement are generalised to provide techniques that are more widely applicable. The programme also delivers some trial software implementations of appropriate algorithms to demonstrate the feasibility of the techniques being advocated and some algorithms for inclusion in its metrology software library.
There are four technical themes:
The use of modelling and simulation is increasingly pervasive in science and engineering.
In all branches of technology there is a move towards digital technology and the use of virtual systems replacing physical systems. This theme concentrates on how to gain confidence in modelling results by understanding modelling error mechanisms and the sensitivity of models to their parameters and configuration.
Molecular modelling was introduced in the previous SSfM programme to provide support for innovation in fields such as nano-technology and advanced materials. The current programme builds on the earlier work and looks at the linking of molecular modelling with engineering scale modelling.
A measured value is incomplete without a quantitative statement of its quality in the form of an uncertainty. The need to evaluate and express the uncertainty associated with a measured value applies generally across all areas of measurement, and arises in the applications of measurement to standardisation, calibration and testing, laboratory accreditation and in support of trade and regulation. The project will maintain the UK NMS at the forefront of the world metrology community in the area of uncertainty evaluation.
This theme aims to ensure that the uncertainties associated with measured values are credible and reliable and are based on objective and defensible methods.
Signal and information analysis are enabling technologies for all branches of metrology.
This theme involves the development and use of tools and techniques to fit data to algebraic models and perform analysis on data and measurements.
Information analysis encompasses model fitting, a process of finding a set of parameters that describe a physical system. These required parameters are indirectly related through a model to quantities that can be measured. Parameter estimates are determined by fitting a model to data, taking into account what is known about the random effects associated with the data. The uncertainty associated with the parameter estimate must also be determined.
The theme builds on earlier work to develop a metrology structure for DSP algorithms and transforms that are increasingly pervasive in measurement systems and instruments.
The aim of this theme is develop and adapt software design and testing methods and tools for application to measurement software.
Software used in measurement systems must perform to an appropriate level according to the risk associated with the given measurement system. This leads to the need to develop and test software to the required standard so that it is fit for purpose.
An important element to this theme is to ensure that the work is adopted throughout the NMS and in the wider community. This theme will ensure that advocacy for good practice in software development is presented to the metrology community in an accessible and usable fashion.
